研究成果目錄：論文及著述

期刊論文：

  1. “Detection of Calcifications in Thyroid Nodules by a Quantitative Method,” K-Y Chen, C-N Chen, M-H Wu, M-C Ho, H-C Tai, W-C Huang, Y-C Chung, Argon Chen (corresponding author), K-J Chang,, Ultrasound in Medicine and Biology, pp. 870-878, 37, 6, 2011.
  2. “Spatial Variance Spectrum Analysis and Its Applications to Unsupervised Detection of Systematic Wafer Spatial Variations”, Jakey Blue and Argon Chen*, in press,  IEEE Transactions on Automation Science and Engineering, 56-66, 8, 1, 2011.
  3.  “Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands,” Argon Chen and Jakey Blue, International Journal of Production Economics, 586-602, 128, 2010.
  4.  “Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis”, Argon Chen and Amos Hong, accepted by IEEE Transactions on Semiconductor Manufacturing, pp 358-369, 23, 3,  2010.
  5.  “Recipe-independent Indicator for Tool Health Diagnosis and Predictive Maintenance,” Argon Chen and Jakey Blue, IEEE Transactions on Semiconductor Manufacturing, pp. 522-535, 22, 4, 2009.
  6. “Taiwan’s paradigm shift – Industrial engineers are shaping a nation,” Argon Chen, Industrial Engineer, pp. 31-34, 40, 10, 2008.
  7. “Weighted least-square Estimation of Demand Product Mix and Its application to Semiconductor Demand,” Argon Chen, K. Yang, Z. Hsia, , International Journal of Production Research (SCI), pp. 4445-4462, 46, 16, 2008.
  8.  “Design of EWMA and CUSUM Control Charts Subject to Random Shifts and Quality Impacts,” Argon Chen and Y.K. Chen, IIE Transactions (SCI), 1127-1141, 39, 12, 2007.
  9. “Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration,” Argon Chen and G.S. Wu, International Journal of Production Research (SCI), pp. 3352-3379, 45, 15, 2007.
  10. “Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning,” Argon Chen, Chia-Hau Hsu and Jakey Lan, International Journal of Production Research (SCI), pp. 2269-2294, 45, 10, 2007.
  11. “Optimal Supply Chain Configurations in Semiconductor Manufacturing,” David Chiang, Ruey-Shan Guo, Argon Chen (Corresponding Author), and Meng-Tse Cheng, International Journal of Production Research (SCI), pp.631-651, 45, 3, 2007.
  12. “Systematic Preprocessing of One-Color Microarray and Multi-Phenotype Data for Discovery of Differentially Expressed Genes,” Tiffany Lin, Argon Chen, and Ju-Hwa Lin, Bulletin of the College of Engineering, NTU, 94, pp.77-98, 2005.
  13. “Design and performance analysis of the EWMA mean estimate for processes subject to random step changes,” Argon Chen and E. A. Elsayed, Technometrics (SCI), pp. 379-389, 44, 4, 2002.
  14. “Age-based double EWMA controller and its application to CMP processes,” Argon Chen and R.-S. Guo, IEEE Transactions on Semiconductor Manufacturing (SCI), 14, 1, 2001.
  15. “多重變異來源特性之半導體製程取樣與統計製程管制策略,” 陳正剛、郭瑞祥、葉珮甄, 中國統計學報, 38, 3, pp.269-280, 2000.
  16. “An alternative mean estimator for processes monitored by SPC charts,” Argon Chen and E. A. Elsayed,  International Journal of Production Research (SCI), 38, 13, pp. 3093-3109, 2000.
  17.  “A Process Controller for Processes subject to Random Disturbances,” R. Guo, J. Chen, A. Chen, and S. Lu,, Journal of Chinese Engineers (SCI, EI), 22, 5, pp. 627-638, 1999.
  18. “An Integrated Approach to Semiconductor Equipment Monitoring,” Argon Chen, Ruey-Shan Guo, Alex Yang, Chwan-Lu Tseng, to appear in Journal of The Chinese Society of Mechanical Engineering (EI), a special issue on Advanced Automation Technology and Production Research, 19, 6, pp. 581-591, 1998.
  19. “An Alternative Dynamic Programming Approach to Allocation Inspection Points in Multistage Production Systems,” Argon Chen, Quality Engineering (EI), 11, 2, pp. 197-205, 1998.
  20. “提昇製程品質控制績效之研究-結合管制圖與移動平均控制法,“ 郭瑞祥、陳正剛、吳廣瀅,管理學報 (年度數理類論文講), 16, 1, pp. 101-124, 1999。
  21. “A Producibility Measure for Quality Characteristics with Design Specifications,” J.H. Byun, E.A. Elsayed, Argon Chen, and R. Bruins, Quality Engineering (EI), Vol.10, No.2, pp.351-358, December 1997.
  22. “An Economic Design of  Control Chart using Quadratic Loss Function,” E.A. Elsayed and Argon Chen, International Journal of Production Research (SCI, EI), 32, 4, 873-887, 1994.
  23. “Optimal levels of Process Parameters for Products with Multiple Characteristics,” E. A. Elsayed and Argon Chen, International Journal of Production Research (SCI, EI), 31, 5, 1117-1132, 1993.

專書章節:

  1. Chapter 17: Age-based Double EWMA  Run to Run Controller, Argon Chen and Ruey-Shan Guo, Run to Run Control in Semiconductor Manufacturing  edited by Moyne, J., Del Castillo, E., and Hurwitz, A.M..
  2. Chapter 19: An Enhanced EWMA Controller for Processes Subject to Random Disturbances, Ruey-Shan Guo, Argon Chen and Jin-Jung Chen, to appear as a Chapter in Run to Run Control in Semiconductor Manufacturing (tentative) edited by Moyne, J., Del Castillo, E., and Hurwitz, A.M..

研討會論文:

  1. “Analysis of Microarray Data with Multiple Phenotypes,” Argon Chen, Proceedings of the 2009 International Conference on Computers and Industrial Engineering, Troyes, France, July 2009.
  2.  “Optimum Sampling for Track PEB CD Integrated Metrology,” Argon Chen, Sean Hsueh, and Jakey Blue, The Fifth Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 2009. “Statistical Data Mining and Its Applications to Microarray Data Analysis,” Argon Chen, The 6th Rocky Mountain Bioinformatics Conference, Aspen/Snowmass, USA, December, 2008.
  3. “Model-based Computing Budget Allocation for Queuing System Simulation,” Argon Chen, L.-C. Chang, C.-H. Chen, INFORMS’2008, Washington D.C., USA, October, 2008.
  4.  “A Systematic Approach to Preprocessing One-color Microarray Intensity Readings,” Argon Chen, Tiffany Lin, and Ju-Hwa Lin, INFORMS Annual Meeting, Seattle USA, November, 2007.
  5. “Statistical Multi-Objective Optimization and Its Application to IC Layout Design for E-Tests, ” Argon Chen, Vic Chen and Chris Hsu, The 14th International Symposium on Semiconductor Manufacturing,  Santa Clara, California USA , October 2007.
  6. “Sample Efficient Regression Trees (SERT) for Yield Loss ,” Argon Chen and Jakey Blue, The 13th International Symposium on Semiconductor Manufacturing, pp. 29-34, Tokyo, Japan, September 2006.
  7. “Recipe-independent Tool Health Indicator and Fault Prognosis,” Argon Chen and Amos Hong, The 13th International Symposium on Semiconductor Manufacturing, pp. 460-463, Tokyo, Japan, September 2006.
  8. “Optimization of Circuit Layout Design and Manufacturing Processes for Fab-wide APC,” Argon Chen and Ellis Chang, European AEC/APC Conference 2006.
  9. “Many-to-Many Correlation Analysis for Small Sample Size and its Application to Semiconductor Yield Analysis,” Argon Chen, and Amos Hong,  The Sixth Asia Pacific Industrial Engineering and Management Systems Conference, Manila, Philippines, December 2005.
  10. “Performance Analysis of Demand Planning Approaches for Aggregating, Forecasting and Disaggregating Interrelated Demands,” Argon Chen and Jakey Lan, The Sixth Asia Pacific Industrial Engineering and Management Systems Conference, Manila, Philippines, December 2005.
  11. “An efficient estimate of response surface confidence interval and its applications to semiconductor yield improvement,” Argon Chen and Jessie Cheng, International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM’2005) Singapore, October 2005.
  12. “Optimal supply chain configurations in semiconductor manufacturing,” David Chiang, Andy Guo, Argon Chen, M.-T. Cheng, J.-B. Chen, B.-C. Chang, International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM’2005) Singapore, October 2005.
  13. “Demand planning hierarchy and its application to semiconductor industry,” Argon Chen and Kenk Chen, Proceedings The Fifth Asia Pacific Industrial Engineering and Management Systems Conference, Gold Coast, Australia, 2004.
  14. “Accommodating engineering knowledge in T2 control chart construction for equipment FDC,” Argon Chen and Chao-Chuan Tsai,  The 13th International Symposium on Semiconductor Manufacturing, Tokyo, Japan, October 2004.
  15. “Semiconductor Product-Mix Estimate with Dynamic Weighting Scheme,” Argon Chen, Ziv Hsia, and Kyle Yang, The 12th International Symposium on Semiconductor Manufacturing, San Jose, USA, October 2003.
  16. “Yield Mining and Improvement with Enhanced Electrical Test Data Correlation,” Chih-Min Fan, Ruey-Shan Guo, Argon Chen, A. Hon, J. Wei, and M.C. King, The 12th International Symposium on Semiconductor Manufacturing, San Jose, USA, October 2003.
  17.  “Data Mining Techniques for Engineering Data Analysis – Issues and Solutions,” Argon Chen, R-S Guo, C-M Fan, Amos Hon, Odey Ho, Legend Hu, John Wei, and Mingchu King, The 11th International Symposium on Semiconductor Manufacturing, Tokyo, Japan, October 2002.
  18. “Aggregation and Forecasting of Interrelated Demands for Effective Operations Planning,” Argon Chen and Chia-Hua Hsu, International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM), Tempe, AZ, April 2002.
  19. “Data Mining and Fault Diagnosis based on Wafer Acceptance Test and In-line Manufacturing Data,” C-M Fan, R-S Guo, Argon Chen, K-C Hsu and C-S Wei, The 10th International Symposium on Semiconductor Manufacturing, Santa Clara, CA, October 2001.
  20. “Statistical Design and Control of Semiconductor Manufacturing Systems,” Argon Chen, R.-S. Guo and P. Lin, The 16th International International Conference on Production Research, Prague, Czech Republic, July, 2001.
  21. “Intelligent Real-time Equipment Preventive Maintenance Scheme,” Argon Chen, R.-S. Guo, and G.S. Wu, The 16th International International Conference on Production Research, Prague, Czech Republic, July, 2001.
  22.  “Statistical Analysis and Design of Semiconductor Manufacturing Systems,” Argon Chen, R.-S. Guo and P. Lin, The 9th International Symposium on Semiconductor Manufacturing, Tokyo, Japan, September, 2000.
  23. “Real-time Equipment Health Evaluation and Dynamic Preventive Maintenance,” Argon Chen, R.-S. Guo, and G.S. Wu, The 9th International Symposium on Semiconductor Manufacturing, Tokyo, Japan, September, 2000.
  24. “An Effective SPC Approach to Monitoring Semiconductor Manufacturing Processes with Multiple Variation Sources,” Argon Chen, R.-S. Guo, and P.C. Yeh, The 9th International Symposium on Semiconductor Manufacturing, Tokyo, Japan, September, 2000.

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